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As we continue to push the boundaries of Moore’s Law, scaling down transistor sizes has become both a necessity and a challenge. While smaller transistors promise faster speeds and greater energy efficiency, they also introduce significant issues that degrade the performance of traditional MOSFET devices.
One of the key factors driving the shift towards FinFET technology is
the increasing difficulty in maintaining control over the MOSFET’s Id-Vg characteristics as gate lengths shrink. But what exactly happens to these devices as they get smaller? Let’s dive into the root causes and challenges that are making the transition to FinFET inevitable.
Short-Channel Effects: The Core of the Problem
As gate lengths (L) in MOSFETs reduce from larger
dimensions like 1μm down to nanometers, the short-channel effects (SCEs) become more pronounced. These effects severely impact the MOSFET’s ability to regulate current, causing two major issues:
- Degradation of Subthreshold Swing (S): Subthreshold swing represents how efficiently the transistor switches off as the gate voltage (Vgs) decreases. In ideal conditions, a low S value (around 60 mV/decade) means the device can easily cut off current as the
gate voltage is reduced. However, as gate lengths shrink, the subthreshold swing worsens, requiring more voltage to reduce the current. This makes it harder to fully turn off the transistor, leading to higher leakage currents and wasted power.
- Reduction in Threshold Voltage (Vt): Another side effect of short-channel effects is the reduction in threshold voltage, the minimum voltage needed to turn the transistor on. As gate lengths shrink, the threshold voltage decreases,
making it difficult to fully switch off the device. This further contributes to leakage currents, where even when the device is supposed to be off, a small current still flows, reducing overall efficiency.